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Test & Measurement World, July/August 2012

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Online now at TMWorld.com Check out these exclusive features on the Test & Measurement World Website: Join the conversation! Add your comments to the T&MW blogs: Do you remember your fi rst scope? Senior Editor Janine Love invites you to share your fond (and not so fond) memories of your first oscilloscope. www.tmworld.com/4390232 Demonstrating enclosure resonance There are times when an increase in harmonic content can't completely be explained by circuit or PC board design. If you've already done a good EMC design and are still getting radiated emission problems, then perhaps resonances in the product enclosure are, in effect, amplifying the internal harmonics. Kenneth Wyatt explains. www.tmworld.com/4390124 Touch me 'cause you can! ISAQ 100 Secure Data Acquisition • High precision measurements 18 bit resolution, 2 Mbit/s • Potential free measurements Up to 3 km optical data transfer • Absolute safety Galvanic Isolation > 1 MV On-desk operation up to 1000 V • Wide input range ±250 V max. input range • Outstanding portability 8000 hours battery power Light weight and compact design • Simple integration OLE automation interface The perfect choice for EMC critical areas and high voltage applications! Find out more at: www.omicron-lab.com/daq Smart Measurement Solutions 120410_Hands_halfpage_V2_PMA.indd 1 Test & Measurement World | JULY/AUGUST 2012 | www.tmworld.com –6– 10.04.2012 10:23:15 DLL-based clock recovery cranks up net bandwidths To meet the bandwidth demands, ever more robust clock recovery schemes are necessary. But, 25% over- head is too high. Enter DLLs (delay locked loops), whose reduced power, size, and complexity combine with simpler transfer functions and improved stability enable clock-recovery circuits to remain locked after dozens of identical bits. www.tmworld.com/4378176 Explain this Senior Technical Editor Martin Rowe needs you to explain something to a non-engineer: how Internet Protocol phones work. www.tmworld.com/4390254 Stay connected with T&MW Join us for discussions about test topics: LinkedIn: linkd.in/uRnG6r

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