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Embedded Systems October 2000 Vol13_11

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makes about anotJl er, in the form ofser- vice caJ ls, can now be verified. The interface and now of data across the test boundary should be well understood. AI; confidence is gained in lower level domains, the test support instru- mentation can be disabled on those domains to reduce the number of checkpoints and increase throughput. If a problem i found, the test support an be re-enabled to collect more data on me specific test case. Leveraging potential In trumentation added to the imple- mentation of UML models allows me models to be leveraged in to tJle te Ling phase of developmen t. Developers can write test cases, execute, and debug and the level of the models. Ideally, instrum ntation should provide a fu ll debug environment at the level of analysis. Full inte ractive manipulation of instances, events, and data should be available, as well as ways to actively stimulate the system, ratJler than just watch it. The instrumentation pro- vides fu ll access to the system under test at the level of UML modeling, allowing a glass box approach to inte- gration testing with greater observabil- ity, controllability, and testabi li ty for embedded systems. Increased observ- ability enabled by instrumentation also allows detection of internal error states without having to propagate the error to the output. This results in asier test case development and short- er debugging time, as th e error i iso- lated much closer to the fault. Once the capability of the full inter- active anaJysis debugger exists, there is an even greater potential for improved quaJity and productivity by adding a batch capability to it. This batch capabil- ity wouJd aJlow automated regression testing, automated data collection of fai l- ure test cases, or application of r;mdom- Free Onboard TCP/IP on this Feature-rich Embedded PC ized test inputs and event sequences to obtain more analysis coverage. esp Gregory Eakman is a 1Jrinci1Jle consultant with Pathfinder Solutions and is a PhD candidate at Boston University in the area of automated testing of model-based soft- ware. He has successfully a1J/)lied model- based software engineering to a varity of applications. Contact grege@t)(lthjindersol.com. References 1. Pathfinder Solutions, "MBSE Software Engineering Process," February 2000: www.pathfindersol.coml download.html. 2. Pressman, Roger S. Software Engineering-A Practitioner's Approach, 3rd Edition . New York: McGraw-Hili, 1992. 3. Object Management Group, "The Unified Modeling Language" Specfication, November 1999: www.omg.org. him at CARD DUPER'" SUppGIts Compact flash, PCMCIA, Smart Media, MMe, MllIlOIY Stick, UIIIGI, SIAM, ATA. and EpsOl1 4~n (SIAM, flash) orr. Call or visit our MICRO/SVS Glendale, CA (818) 244-4600 • Fax: (818) 244-4246 website for the Netsock/l00 data sheet or a FREE 284-page Handbook Contact us today at www.cardduper.com. before you drive yourself crazy trying to program memory cards the old fashioned way. International Microsystems, Inc. Milpitas, CA • (408) 942-1001 www.CardDuper.com Embedded Systems Programming OCTOBER 2000 147

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